MOSFETThe metal-oxide-semiconductor field-effect transistor (MOSFET, MOS-FET, or MOS FET) is a type of field-effect transistor (FET), most commonly fabricated by the controlled oxidation of silicon. It has an insulated gate, the voltage of which determines the conductivity of the device. This ability to change conductivity with the amount of applied voltage can be used for amplifying or switching electronic signals. A metal-insulator-semiconductor field-effect transistor (MISFET) is a term almost synonymous with MOSFET.
ElectronThe electron (_Electron or _beta-) is a subatomic particle with a negative one elementary electric charge. Electrons belong to the first generation of the lepton particle family, and are generally thought to be elementary particles because they have no known components or substructure. The electron's mass is approximately 1/1836 that of the proton. Quantum mechanical properties of the electron include an intrinsic angular momentum (spin) of a half-integer value, expressed in units of the reduced Planck constant, ħ.
Congestion pricingCongestion pricing or congestion charges is a system of surcharging users of public goods that are subject to congestion through excess demand, such as through higher peak charges for use of bus services, electricity, metros, railways, telephones, and road pricing to reduce traffic congestion; airlines and shipping companies may be charged higher fees for slots at airports and through canals at busy times. Advocates claim this pricing strategy regulates demand, making it possible to manage congestion without increasing supply.
SedenionIn abstract algebra, the sedenions form a 16-dimensional noncommutative and nonassociative algebra over the real numbers, usually represented by the capital letter S, boldface S or blackboard bold . They are obtained by applying the Cayley–Dickson construction to the octonions, and as such the octonions are isomorphic to a subalgebra of the sedenions. Unlike the octonions, the sedenions are not an alternative algebra. Applying the Cayley–Dickson construction to the sedenions yields a 32-dimensional algebra, sometimes called the 32-ions or trigintaduonions.
Bandwidth-limited pulseA bandwidth-limited pulse (also known as Fourier-transform-limited pulse, or more commonly, transform-limited pulse) is a pulse of a wave that has the minimum possible duration for a given spectral bandwidth. Bandwidth-limited pulses have a constant phase across all frequencies making up the pulse. Optical pulses of this type can be generated by mode-locked lasers. Any waveform can be disassembled into its spectral components by Fourier analysis or Fourier transformation.
Singular point of an algebraic varietyIn the mathematical field of algebraic geometry, a singular point of an algebraic variety V is a point P that is 'special' (so, singular), in the geometric sense that at this point the tangent space at the variety may not be regularly defined. In case of varieties defined over the reals, this notion generalizes the notion of local non-flatness. A point of an algebraic variety which is not singular is said to be regular. An algebraic variety which has no singular point is said to be non-singular or smooth.
Transmission electron microscopyTransmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Scanning transmission electron microscopyA scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.
