Publication

Subwavelength-size solid immersion lens

Related publications (37)

Submicron hollow spot generation by solid immersion lens and structured illumination

Hans Peter Herzig, Toralf Scharf, Myun Sik Kim

We report on the experimental and numerical demonstration of immersed submicron-size hollow focused spots, generated by structuring the polarization state of an incident light beam impinging on a micro-size solid immersion lens (μ-SIL) made of SiO2. Such s ...

Institute of Physics (IoP) and Deutsche Physikalische Gesellschaft2012

Resolution and Complex Deconvolution in Holographic Microscopy

Yann Jérôme Michel Pascal Cotte

Interest in high resolution imaging techniques has recently multiplied due to their importance in bio-medical research. Quantitative phase measurements by holographic microscopy is an extraordinary tool to gain new understanding of transparent biological s ...

EPFL2012

On the Characteristics of Highly Confined Light Fields

Myun Sik Kim

The Investigation of highly confined light fields created by different mechanisms, such as refraction, diffraction, and scattering, are the main subject of this thesis. We distinguish a specific scattering phenomenon of dielectric microspheres from general ...

EPFL2011

Scanning Near-Field Optical Microscopy of Living Cells in Liquid, Elaboration of New SNOM Probes and Detection Methods

Kanat Dukenbayev

The aim of the present PhD thesis is the elaboration of new, home-made Scanning Near-field Optical Microscope (SNOM or NSOM), and the demonstration of its great potential for high-resolution topography and fluorescence investigations of soft and solid samp ...

EPFL2011

Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes

Myun Sik Kim

Introduction Definitions of microlens and Challenges for small size 2. High Resolution Interference Microscope (HRIM) System and Upgraded features 5 frame phase shift algorithm 3. Principle of characterization of microlenses Standard tests Unconventiona ...

2010

Several micron-range measurements with sub-nanometric resolution by the use of dual-wavelength digital holography and vertical scanning

Christian Depeursinge, Tristan Colomb, Jonas Kühn

Reflection digital holographic microscopy (DHM) is a very powerful technique allowing measuring topography with a sub-nanometer axial resolution from a single hologram acquisition. But as most of interferometer methods, the vertical range is limited to hal ...

SPIE2009

Enhancement and subwavelength confinement of light in plasmonic nanostructures

Holger Fischer

This work includes the fabrication of plasmonic nanostructures as well as the investigation of their optical properties in the near-field and in the farfield. As expressed in the title of this thesis the focus lies in the subwavelength confinement and enha ...

EPFL2008

Fluorescence correlation spectroscopy with sub-diffraction-limited resolution using near-field optical probes

Dusan Vobornik

We report fluorescence correlation spectroscopy (FCS) measurements using near-field scanning optical microscopy (NSOM) probes to produce a sub-diffraction-limited observation area. An order of magnitude reduction in the area compared to confocal FCS has be ...

American Institute of Physics2008

Sub-Nanometer Resolution over Several Microns Range with Real-Time Dual- Wavelength Digital Holographic Microscopy

Christian Depeursinge, Tristan Colomb, Christophe Pache, Jonas Kühn, Florian Charrière

Single-acquisition dual-wavelength digital holographic microscopy provides real-time phase measurement range over several microns. We demonstrate axial resolution enhancement down to sub-nanometer range thanks to the non- correlation between both available ...

OSA2008

Resonantly Enhanced Near-Field Lithography

Demetri Psaltis

We propose the combination of a planar optical resonator and a solid immersion lens for resonantly enhanced non-contact near-field lithography. Subwavelength small spots can be produced by exciting the Bessel modes of the resonator. (C) 2008 Optical Societ ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2008

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