Publication

RTS Noise Characterization in Single-Photon Avalanche Diodes

Edoardo Charbon, Lucio Carrara, Cristiano Niclass, Mohammad Azim Karami, Matthew Fishburn
2010
Journal paper

Abstract

Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-mu m CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-mu m CMOS technology. The RTS characteristics are evaluated experimentally and verified theoretically with respect to bias and temperature.

Official source

https://infoscience.epfl.ch/record/172361?ln=en

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RTS Noise Characterization in Single-Photon Avalanche Diodes

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