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Design of T-GEM detectors for X-ray diagnostics on JET

Patrick Blanchard
2013
Conference paper
Abstract

Upgraded high-resolution X-ray diagnostics on JET is expected to monitor the plasma radiation emitted by W46+ and Ni26+ ions at 2.4 keV and 7.8 keV photon energies, respectively. Both X-ray lines will be monitored by new generation energy-resolved micropattern gas detectors with 1-D position reconstruction capability. The detection structure is based on triple GEM (T-GEM) amplification structure followed by the strip readout electrode. This article presents a design of new detectors and prototype detector tests. (C) 2012 Elsevier B.V. All rights reserved.

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