Upgraded high-resolution X-ray diagnostics on JET is expected to monitor the plasma radiation emitted by W46+ and Ni26+ ions at 2.4 keV and 7.8 keV photon energies, respectively. Both X-ray lines will be monitored by new generation energy-resolved micropattern gas detectors with 1-D position reconstruction capability. The detection structure is based on triple GEM (T-GEM) amplification structure followed by the strip readout electrode. This article presents a design of new detectors and prototype detector tests. (C) 2012 Elsevier B.V. All rights reserved.
Sandor Kasas, María Inés Villalba
Henrik Moodysson Rønnow, Markus Scholz
Marcos Rubinstein, Antonio Sunjerga, Farhad Rachidi-Haeri, Thomas Chaumont