The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.
Roland Logé, Cyril Cayron, Mathijs Pieter van der Meer, Junfeng Xiao
Roland Logé, Cyril Cayron, Aryan Rezaei Rad