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Harnessing the damping properties of materials for high-speed atomic force microscopy

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Miniature active damping stage for scanning probe applications in ultra high vacuum

Klaus Kern, Maximilian Assig, Carola Strasser

Scanning probe microscope (SPM) experiments demand a low vibration level to minimize the external influence on the measured signal. We present a miniature six-degree of freedom active damping stage based on a Gough-Stewart platform (hexapod) which is posit ...

2012

A vibration suppression approach to high-speed atomic force microscopy

Georg Fantner

The possibility of many new applications and novel scientific observations can be provided by efficient and reliable high-speed atomic force microscopy techniques. However, the reliability of the AFM images decreases significantly as the imaging speed is i ...

2012

High speed atomic force microscopy can provide the possibility of many new scientific observations and applications ranging from nano-manufacturing to the study of biological processes. However, the limited imaging speed has been an imperative drawback of ...

American Institute of Physics2011

Quantum Point Contact Microscopy

Klaus Kern, Peter Wahl

We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped a ...

2011

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We present 2D cantilever arrays for parallel AFM and their fabrication process using a silicon nitride cantilever with molded tip as the base element of the array. They are designed either for (i) force indentation onto living cells and stiffness mapping, ...

Elsevier Science, Reg Sales Off, Customer Support Dept, 655 Ave Of The Americas, New York, Ny 10010 Usa2011

Sharp High-Aspect-Ratio AFM Tips Fabricated by a Combination of Deep Reactive Ion Etching and Focused Ion Beam Techniques

Luis Guillermo Villanueva Torrijo

The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 or nanoscaled structures, standard silicon atomic forc ...

2010

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We have designed and fabricated a low-range (ca. 100 mN) thick-film piezoresistive force sensor with a cantilever beam fabricated in LTCC (Low Temperature Co-fired Ceramic). The beam was soldered onto a standard thick-film 25.4 x 12.7 mm signal conditionin ...

Elsevier2009

Scanning probe microscopy has become, nowadays, a branch of microscopy widely used to image surfaces of different specimens. Among the various applications, the magnetic imaging is one of the most exciting scanning probe microscopy techniques. It allows th ...

EPFL2007

Atomic force microscopy studies of nanotribology and nanomechanics

Ismaël Palaci

This thesis comes within the scope of tribology studies at the nanometer scale. The experimental techniques used in this work are essentially related to atomic force microscopy, which gives a direct access to the topography and forces of the studied system ...

EPFL2007

Recently electrically conducting SPM probes were used as read/write sensor of magneto-resistive nanopillars and ferroelectric domains in the development of >1 Tb/inch2 data storage. Since metal coated (platinum (Pt) or Pt/iridium) silicon (Si) probes are n ...

2006