Method and apparatus of using a scanning probe microscope
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High speed atomic force microscopy can provide the possibility of many new scientific observations and applications ranging from nano-manufacturing to the study of biological processes. However, the limited imaging speed has been an imperative drawback of ...
The probe has support cylinder (214) that is slidingly provided in distal portion of internal lumen. Several shafts coupled to support cylinder and arranged to be selectively extended from distal end of elongated shaft. Several conductive traces provided o ...
Infrared scanning near-field optical microscopy (IR-SNOM) is an extremely powerful analytical instrument since it combines IR spectroscopy's high chemical specificity with SNOM's high spatial resolution. In order to do this in the infrared, specialty chalc ...
We have recently demonstrated that indentation-type atomic force microscopy (IT-AFM) is capable of detecting early onset osteoarthritis (OA) (Stolz, 2009). This study was based on biopsies, using a desk-top commercial atomic force microscope (AFM). However ...
Japan Society of Histological Documentation / International Society of Histology and Cytology2011
We have designed and fabricated a low-range (ca. 100 mN) thick-film piezoresistive force sensor with a cantilever beam fabricated in LTCC (Low Temperature Co-fired Ceramic). The beam was soldered onto a standard thick-film 25.4 x 12.7 mm signal conditionin ...
The Phoenix microscopy station, designed for the study of Martian dust and soil,consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimet ...
The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 or nanoscaled structures, standard silicon atomic forc ...
NOVELTY - The microscope (11) has a set of four actuators (14, 16, 18, 20) i.e. piezoelectric actuators, and a strain gauge coupled to two opposed actuators (14, 18), arranged in opposed push or push-pull configuration to measure the differential motion of ...
In this study, we introduce five unique scanning vibes developed in our laboratory for different fields of application These probes are the results of excellent collaborations with many external partners Each probe possesses many advanced features that one ...
This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and ...