Stabilization of ferroelectric HfxZr1-xO2 films using a millisecond flash lamp annealing technique
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We formulate an approach to the size effect problem in ferroelectric-electrode systems where ab initio calculations are combined with a phenomenological framework. The parameters of the model can be extracted from the calculations, while experimentally ver ...
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The integration of ferroelectrics in electronic devices requires that they be used in the form of thin films, which implies that for such systems finite-size effects related to the presence of a ferroelectric-electrode interface become important. In this t ...
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In this work, the effect of introducing tetragonal yttria-stabilized zirconia (TZ) particles in soft [Pb0.98Ba0.01][(Zr0.53Ti0.47)(0.98)Nb-0.02]O-3 (PZT) was investigated. Both microstructure and electrical properties of the PZT-xTZ (x = 0, 2, 5, 10, 20 vo ...
