An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
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The focused electron beam induced deposition process is a promising technique for nano and micro patterning. Electrons can be focused in sub-angström dimensions, which allows atomic-scale resolution imaging, analysis, and processing techniques. Before the ...
High resolution magnetic force microscopy plays an important role in the development of magnetic data storage media. Particularly the envisioned increase of the storage density to 1TBit per sqinch within the next five years requires an ongoing development ...
Since its development in 1986, the Atomic force microscope (AFM) has become a revolutionary tool for surface analysis. AFM is of special interest to biologists because of its ability to operate in liquids. Applications include imaging molecules, cells, tis ...
Atomic Force Microscope is of special interest to biologists since it enables real time imaging and force measurements on biological tissue. To observe the biological process of interest in a reasonable time with high force sensitivity, high resonance freq ...
A combined atomic force and scanning electrochemical microscope probe is presented. The probe is electrically insulated except at the very apex of the tip, which has a radius of curvature in the range of 10-15 nm. Steady-state cyclic voltammetry measuremen ...
We present a unique probe that is based on a quartz tuning fork and a microfabricated cantilever. The probe is self-actuating and self-sensing. The cantilever can be tailored to the needs of specific applications, in this case to feature an electrically co ...
This thesis further explores the possibilities of scanning near-field optical microscopy (SNOM) in both materials and life sciences. Two experimental SNOM setups were developed: one designed for infrared spectroscopy applications and the other for the imag ...
From micro-assembly to biological observation, the optical microscope remains one of the most important tools for observing below the threshold of the naked human eye. However, in its conventional form, it suffers from a trade-off between resolution and fi ...
In this work the development of a low-temperature scanning probe microscope and the investigation of thin insulating films at the atomic limit is presented. The scanning probe microscope has been designed in a modular way to provide large flexibility for t ...
This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for mea ...