Principal curvatureIn differential geometry, the two principal curvatures at a given point of a surface are the maximum and minimum values of the curvature as expressed by the eigenvalues of the shape operator at that point. They measure how the surface bends by different amounts in different directions at that point. At each point p of a differentiable surface in 3-dimensional Euclidean space one may choose a unit normal vector. A normal plane at p is one that contains the normal vector, and will therefore also contain a unique direction tangent to the surface and cut the surface in a plane curve, called normal section.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Bilayer grapheneBilayer graphene is a material consisting of two layers of graphene. One of the first reports of bilayer graphene was in the seminal 2004 Science paper by Geim and colleagues, in which they described devices "which contained just one, two, or three atomic layers" Bilayer graphene can exist in the AB, or Bernal-stacked form, where half of the atoms lie directly over the center of a hexagon in the lower graphene sheet, and half of the atoms lie over an atom, or, less commonly, in the AA form, in which the layers are exactly aligned.
Strain gaugeA strain gauge (also spelled strain gage) is a device used to measure strain on an object. Invented by Edward E. Simmons and Arthur C. Ruge in 1938, the most common type of strain gauge consists of an insulating flexible backing which supports a metallic foil pattern. The gauge is attached to the object by a suitable adhesive, such as cyanoacrylate. As the object is deformed, the foil is deformed, causing its electrical resistance to change.
Curvature of Riemannian manifoldsIn mathematics, specifically differential geometry, the infinitesimal geometry of Riemannian manifolds with dimension greater than 2 is too complicated to be described by a single number at a given point. Riemann introduced an abstract and rigorous way to define curvature for these manifolds, now known as the Riemann curvature tensor. Similar notions have found applications everywhere in differential geometry of surfaces and other objects. The curvature of a pseudo-Riemannian manifold can be expressed in the same way with only slight modifications.
Finite strain theoryIn continuum mechanics, the finite strain theory—also called large strain theory, or large deformation theory—deals with deformations in which strains and/or rotations are large enough to invalidate assumptions inherent in infinitesimal strain theory. In this case, the undeformed and deformed configurations of the continuum are significantly different, requiring a clear distinction between them. This is commonly the case with elastomers, plastically-deforming materials and other fluids and biological soft tissue.
NanomaterialsNanomaterials describe, in principle, materials of which a single unit is sized (in at least one dimension) between 1 and 100 nm (the usual definition of nanoscale). Nanomaterials research takes a materials science-based approach to nanotechnology, leveraging advances in materials metrology and synthesis which have been developed in support of microfabrication research. Materials with structure at the nanoscale often have unique optical, electronic, thermo-physical or mechanical properties.
Electron microscopeAn electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
Riemann curvature tensorIn the mathematical field of differential geometry, the Riemann curvature tensor or Riemann–Christoffel tensor (after Bernhard Riemann and Elwin Bruno Christoffel) is the most common way used to express the curvature of Riemannian manifolds. It assigns a tensor to each point of a Riemannian manifold (i.e., it is a tensor field). It is a local invariant of Riemannian metrics which measures the failure of the second covariant derivatives to commute. A Riemannian manifold has zero curvature if and only if it is flat, i.
Constant curvatureIn mathematics, constant curvature is a concept from differential geometry. Here, curvature refers to the sectional curvature of a space (more precisely a manifold) and is a single number determining its local geometry. The sectional curvature is said to be constant if it has the same value at every point and for every two-dimensional tangent plane at that point. For example, a sphere is a surface of constant positive curvature.
