Practical method for high-resolution imaging of polymers by low-voltage scanning electron microsopy
Graph Chatbot
Chat with Graph Search
Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
We present the first results from the upgraded version of the scanning photoemission spectromicroscope MAXIMUM, bared on synchrotron undulator fight and on a multilayer-coated Schwarzschild objective. The upgrade involved nearly all parts of the instrument ...
A review of experimental results obtained by different techniques is presented on the problem of zinc diffusion. Zinc diffusion was carried out on Si-doped GaAs (n almost-equal-to 10(18) cm-3) and on multiple quantum well (MQW) structures. The samples were ...
Metal matrix composites composed of high-purity aluminum and Du Pont PRD-166 continuous zirconia-stabilized polycrystalline alumina fibers are fabricated by liquid metal infiltration using three different casting procedures. The microstructure of the compo ...
High resolution and analytical transmission electron microscopy (TEM) and X-ray diffraction (XRD) were used to characterize short-period strained-layer Sim-Gen superlattices ( m monolayers Si, n monolayers Ge, total number of periods N≤ 145, total thicknes ...
High-Resolution Electron Microscopy observations of gold particles are compared with images calculated using the multislice method for both regular f.c.c.-cuboctahedron- and Multiply-Twinned Particles -icosahedron, decahedron-. Although simulated for idea ...
The resolution of TEM fluorescent screens is one of the limiting factors for the acquisition of CCTV images with a high definition (1024 x 1024 pixels or more). Our comparison between YAG single crystal and ZnCdS powder phosphors screens shows that this l ...
It is shown that Te can be used as a surfactant for the growth of highly strained InxGa1-xAs on GaAs(001). As observed by reflection high-energy electron diffraction analysis during growth, adsorption of Te on the GaAs surface prior to the growth of InxGa1 ...
Angle-resolved, synchrotron-radiation photoemission and low-energy electron-diffraction studies of single-crystal Bi2Sr2CaCu2Ox high-temperature superconductors establish that the [100] and [010] directions exhibit quantitatively different structural and e ...
Using a pair of backscattered electron detectors in the scanning electron microscope, images can be produced in which the intensity is dependent solely on the molecular weight of the imaged area, and independent of small fluctuations in topography. The use ...
Characterization of impurety diffusion induced disordering in GaAs/AlGaAs multiquantum well structures, grown by molecular beam epitaxy, has been carried out by scanning electron microscopy. ...