Observation of domain nucleation and growth during switching process
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Dielectric properties of perovskites are studied both to gain insight into fundamental aspects of the freezing of polar disorder, and to investigate their technological potential. The dynamics of freezing of polar disorder is investigated in single crystal ...
Degradation of piezoelectric properties has been studied in ferroelectric PZT films by means of optical interferometry. The degradation under de bias and aging of poled films have been observed. The decay of piezoelectric coefficient with time is described ...
Pb(Zr0.70Ti0.30)O-3 rhombohedral thin films of (100), (110)/(111) and (111) textures were prepared on Si wafers with Ti/Pt electrodes. Microstructures and textures were characterized by XRD, SEM, TEM, and AFM. Ferroelectric, dielectric and fatigue properti ...
The switching, fatigue and rejuvenation phenomena of ferroelectric PZT thin films with differently processed electrode-PZT interfaces and of different thicknesses have been investigated. The ferroelectric contribution to the switching parameters has been i ...
Piezoelectric properties of Pb(Zr,Ti)O-3 thin films are investigated as a function of the number of bipolar (switching) and unipolar (nonswitching) voltage pulses. The longitudinal piezoelectric coefficient d(33) decreases with bipolar fatigue reflecting t ...
A strong influence of ferroelectric polarization on d.c. conduction has been observed in PZT thin films with Pt electrodes. It is shown that the current-voltage response taken for measuring times of hundreds of seconds at room temperature is controlled by ...
Pyroelectric PbTiO3 thin films devices with two temperature compensating elements on a SiO2/Si3N4 membranes have been fabricated and characterized. The measured voltage responsivity as a function of radiation modulation frequency has been compared to finit ...