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Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.
Covers the basics of transmission electron microscopy, including components, operation, imaging modes, diffraction analysis, and the interaction of high-energy electrons with matter.
Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
