Lecture

Advanced SEM & FIB

In course

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Description

This lecture covers advanced scanning electron microscopy (SEM) techniques, including low voltage imaging, detectors, and analytical SEM. It also explores the principles and applications of focused ion beam (FIB) technology for imaging, milling, and TEM sample preparation.

Instructors (2)

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ad pariatur

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Official source

https://mediaspace.epfl.ch/media/0_tpuzcmjc

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Philosophy

Aesthetics: Topics in aesthetics

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