Publications associées à Selected-ion flow-tube mass spectrometry

Adding Color to Mass Spectra of Biopolymers: Charge Determination Analysis (CHARDA) Assigns Charge State to Every Ion Peak

Yury Tsybin, Natalia Gasilova, Laure Menin, Anton Kozhinov, Konstantin Nagornov

Traditionally, mass spectrometry (MS) output is the ion abundance plotted versus the ionic mass-to-charge ratio m/z. While employing only commercially available equipment, Charge Determination Analysis (CHARDA) adds a third dimension to MS, estimating for ...

Amer Chemical Soc2024

Simulating energetic particle losses in JET plasmas with a reverse integration biasing scheme

Mario Ludovico Podesta, Matteo Vallar

An integrated energetic particle transport model has been constructed in JET plasmas constrained by experimental fast ion loss measurements. The model incorporates a synthetic fast ion loss detector identical to JET's thin-foil Faraday cup fast ion loss de ...

IOP Publishing Ltd2022

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Anders Meibom, Stéphane Laurent Escrig, Florent Olivier Vivien Plane, Lukas Baumgartner, Thomas Bovay

Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. ...

SWISS CHEMICAL SOC2022

Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods

Franz-Josef Haug, Aïcha Hessler-Wyser, Quentin Thomas Jeangros, Audrey Marie Isabelle Morisset, Philippe Wyss, Mario Joe Lehmann

This study evaluates the secondary electron (SE) dopant contrast in scanning electron microscopy (SEM) and helium ion microscopy (HIM) on boron implanted silicon sample. Complementary techniques like secondary ion mass spectrometry and electrochemical capa ...

IOP PUBLISHING LTD2021

Passivating Polysilicon Recombination Junctions for Crystalline Silicon Solar Cells

Christophe Ballif, Franz-Josef Haug, Aïcha Hessler-Wyser, Quentin Thomas Jeangros, Andrea Ingenito, Audrey Marie Isabelle Morisset, Philippe Wyss, Mario Joe Lehmann

Polysilicon recombination junctions whose n-type bottom layers double as a passivating contact to the silicon surface are investigated. Such recombination junctions are a key element in the interconnection of tandem devices with a silicon bottom cell, and ...

2021

Nanoscale Mass-Spectrometry Imaging of Grain Boundaries in Perovskite Semiconductors

Mohammad Khaja Nazeeruddin, Hiroyuki Kanda, Iwan Zimmermann, Paul Gratia

Incorporation of alkali metals such as Cs+, Rb+, and K+ into hybrid organic-inorganic halide lead perovskites (HOIPs) generally improves the optoelectronic properties of HOIPs. However, it is still uncertain how alkali metals interact and distribute within ...

2020

LC-APCI(-)-MS Determination of 1-Chloro-2,4-dinitrobenzene, a Model Substrate for Glutathione S-Transferases

Kristin Schirmer, Alena Tierbach

1-Chloro-2,4-dinitrobenzene (CDNB) is widely used as a model substrate for measuring the enzyme activity of glutathione S-transferases in toxicity studies and in studies focusing on the metabolic capacity of different test systems. To allow the quantificat ...

AMER CHEMICAL SOC2020

Emulator Design and Generation of Synthetic Dataset in Multi-Ion Sensing

Giovanni De Micheli, Sandro Carrara, Mandresy Ivan Ny Hanitra, Danilo Demarchi

Multi-ion potentiometric sensing becomes challenging for mixed-ion samples in which interfering electrolytes significantly alter the response of each single sensor. Therefore, an emulator based on the phase-boundary potential model is proposed to simulate ...

IEEE2020

A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics

Franz-Josef Haug, Aïcha Hessler-Wyser, Quentin Thomas Jeangros, Andrea Ingenito, Gizem Nogay, Mario Joe Lehmann

A method for rapid quantitative imaging of dopant distribution using secondary ion mass spectrometry (SIMS) is described. The method is based on SIMS imaging of the cross-section of a reference sample with a known concentration profile. It is demonstrated ...

CAMBRIDGE UNIV PRESS2019

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Selected-ion flow-tube mass spectrometry

Adding Color to Mass Spectra of Biopolymers: Charge Determination Analysis (CHARDA) Assigns Charge State to Every Ion Peak

Study of fast-ion-driven toroidal Alfvén eigenmodes impacting on the global confinement in TCV L-mode plasmas

Simulating energetic particle losses in JET plasmas with a reverse integration biasing scheme

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods

Passivating Polysilicon Recombination Junctions for Crystalline Silicon Solar Cells

Nanoscale Mass-Spectrometry Imaging of Grain Boundaries in Perovskite Semiconductors

LC-APCI(-)-MS Determination of 1-Chloro-2,4-dinitrobenzene, a Model Substrate for Glutathione S-Transferases

Emulator Design and Generation of Synthetic Dataset in Multi-Ion Sensing

A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics

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Chattez avec Graph Search

Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Adding Color to Mass Spectra of Biopolymers: Charge Determination Analysis (CHARDA) Assigns Charge State to Every Ion Peak

Passivating Polysilicon Recombination Junctions for Crystalline Silicon Solar Cells

Simulating energetic particle losses in JET plasmas with a reverse integration biasing scheme

Emulator Design and Generation of Synthetic Dataset in Multi-Ion Sensing

A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics

Study of fast-ion-driven toroidal Alfvén eigenmodes impacting on the global confinement in TCV L-mode plasmas

Nanoscale Mass-Spectrometry Imaging of Grain Boundaries in Perovskite Semiconductors

LC-APCI(-)-MS Determination of 1-Chloro-2,4-dinitrobenzene, a Model Substrate for Glutathione S-Transferases