Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure.
In other words, the response of vectors (patterns) from a good circuit is compared with the response of vectors (using the same patterns) from a DUT (device under test). If the response is the same or matches, the circuit is good. Otherwise, the circuit is not manufactured as it was intended.
DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation, or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented.
DFT techniques have been used at least since the early days of electric/electronic data processing equipment. Early examples from the 1940s/50s are the switches and instruments that allowed an engineer to "scan" (i.e., selectively probe) the voltage/current at some internal nodes in an analog computer [analog scan]. DFT often is associated with design modifications that provide improved access to internal circuit elements such that the local internal state can be controlled (controllability) and/or observed (observability) more easily.
Cette page est générée automatiquement et peut contenir des informations qui ne sont pas correctes, complètes, à jour ou pertinentes par rapport à votre recherche. Il en va de même pour toutes les autres pages de ce site. Veillez à vérifier les informations auprès des sources officielles de l'EPFL.
The course provides in depth knowledge on how to design an energy autonomous microsystem embedding sensors with wireless transmission of information. It covers the energy generation, power management,
Introduction to advanced topics in analog and mixed-signal CMOS circuits at the transistor level. The course will focus on practical aspects of IC design, quantitative performance measures, and design
Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test technique
La CAO électronique (pour Conception assistée par ordinateur électronique), nommée également en anglais EDA (pour Electronic design automation), est la catégorie des outils servant à la conception et la production des systèmes électroniques allant des circuits imprimés jusqu'aux circuits intégrés. Le terme CAO est aussi utilisé pour désigner la CAO mécanique, la conception assistée par ordinateur et la fabrication assistée par ordinateur en électronique et en électrotechnique.
,
Dual-channel gate driver is commonly utilized in the industry for accommodating the widespread use of half-bridge power modules. As wide-bandgap devices become increasingly prevalent due to their superior switching characteristics compared with conventiona ...
The demise of Moore's Law and Dennard scaling has resulted in diminishing performance gains for general-purpose processors, and so has prompted a surge in academic and commercial interest for hardware accelerators.Specialized hardware has already redefined ...
Explore les techniques de test pour les systèmes VLSI numériques, couvrant la modélisation des défauts, la génération de modèles de test et la conception pour la testabilité.
Couvre la génération de modèles vectoriels de test, la modélisation des défauts, les tests structurels et fonctionnels et la mise en œuvre de l'expansion dans le temps.
Side-channel CPU disassembly is a side-channel attack that allows an adversary to recover instructions executed by a processor. Not only does such an attack compromise code confidentiality, it can also reveal critical information on the system’s internals. ...