Résonance

Résumé

La résonance est un phénomène selon lequel certains systèmes physiques (électriques, mécaniques) sont sensibles à certaines fréquences. Un système résonant peut accumuler une énergie, si celle-ci est appliquée sous forme périodique, et proche d'une fréquence dite « fréquence de résonance ». Soumis à une telle excitation, le système va être le siège d'oscillations de plus en plus importantes, jusqu'à atteindre un régime d'équilibre qui dépend des éléments dissipatifs du système, ou bien jusqu'à une rupture d'un composant du système. Si on soumet un système résonant à un degré de liberté, non plus à une excitation périodique, mais à une percussion (pour les systèmes mécaniques), ou à une impulsion (pour les systèmes électriques), alors le système sera le siège d'oscillations amorties, sur une fréquence proche de sa fréquence propre et retournera progressivement à son état stable. Les domaines où la résonance intervient sont innombrables : balançoire enfantine, mais aussi résonances ac

Source officielle

https://fr.wikipedia.org/wiki/R%C3%A9sonance

À propos de ce résultat

Cette page est générée automatiquement et peut contenir des informations qui ne sont pas correctes, complètes, à jour ou pertinentes par rapport à votre recherche. Il en va de même pour toutes les autres pages de ce site. Veillez à vérifier les informations auprès des sources officielles de l'EPFL.

Publications associées (100)

Publications associées

Chargement

Personnes associées (238)

Personnes associées

Chargement

Unités associées (82)

Unités associées

Chargement

Concepts associés (160)

Concepts associés

Chargement

Cours associés (132)

Cours associés

Chargement

Séances de cours associées (382)

Séances de cours associées

Chargement

Piezoelectric energy harvesters (PEHs) are widely deployed in many self-sustaining systems, and proper rectifier circuits can significantly improve the energy conversion efficiency and, thus, increase the harvested energy. Various active rectifiers have been proposed in the past decade, such as synchronized switch harvesting on inductor (SSHI) and synchronous electric charge extraction (SECE). This article presents a sense-andset (SaS) rectifier that achieves maximum-power-point-tracking (MPPT) of PEHs and maintains optimal energy extraction for different input excitation levels and output voltages. The proposed circuit is fabricated in the 0.18-μm CMOS process with a 0.47-mm 2 core area, a 230-nW active power, and a 7-nW leakage power. Measured with a commercial PEH device (Mide PPA-1022) at 85and 60-Hz vibration frequency, the proposed circuit shows 512% and 541% power extraction improvement [figure of merit (FoM)] compared with an ideal full-bridge rectifier (FBR) for ON-resonance and OFF-resonance vibrations, respectively, while maintaining high efficiency across different input levels and PEH parameters.

IEEE2019

Chargement

Recently, a novelmulti-turn injection technique was proposed. It is based on beam merging via resonance crossing. The various beamlets are successively injected and merged back by crossing a stable resonance generated by non-linear magnetic fields. Space charge is usually a crucial effect at injection in a circular machine and it could have an adverse impact on the phase space topology required for merging the various beamlets. Numerical simulations were performed to assess the stability of the merging process as a function of injected beam charge. The results are presented and discussed in this paper.

2010

Chargement

Focused electron- and ion-beam induced processes

Vinzenz Friedli

Focused electron- and ion-beam induced processing are well established techniques for local deposition and etching that rely on decomposition of precursor molecules by irradiation. These high-resolution nanostructuring techniques have various applications in nanoscience including attach-and-release procedures in nanomanipulation and fabrication of sensors (magnetic, optical and thermal) for scanning probe microscopy. However, a complete physical and chemical understanding of the process is hampered by the lack of suitable means to monitor and to access the numerous interrelated and time-varying process parameters (deposition and etch rate, yield, molecule flux and adsorption/desorption). This thesis is a first attempt to fill this gap. It is based on experimental and simulative approaches for the determination of process conditions and mechanical properties of deposited materials: Mass and force sensors: The use of tools merging micromechanical cantilever sensors and scanning electron microscopy was demonstrated for in situ monitoring and analysis. A cantilever-based resonant mass sensing setup was developed and used for real-time mass measurements. A noise level at the femtogram-scale was achieved by tracking the resonance frequency of a temperature stabilized piezoresistive cantilever using phase-locking. With this technique the surface coverage and residence time of (CH3)3PtCpCH3 molecules, the mass deposition rate, the yield, and the material density of corresponding deposits were measured. In situ cantilever-based static force sensing and mechanical modal vibration analysis were employed to investigate the Young's modulus and density of individual high aspect ratio deposits from the precursor Cu(hfac)2. Precursor supply simulations and experiments: A prerequisite to understand and quantify irradiative precursor chemistry is the knowledge of the local flux of molecules impinging on the substrate. Therefore, Monte Carlo simulations of flux distributions were developed and gas flows injected into a vacuum chamber were analyzed experimentally for the precursors Co2(CO)8, (hfac)CuVTMS, and [(PF3)2RhCl]2. The process parameters extracted from the mentioned approaches are valuable input for numerical focused electron- and ion-beam induced process models (Monte Carlo, continuum). We evaluated the precursor surface diffusion coefficient and the electron impact dissociation cross-section by relating deposit shapes to a continuum model.

EPFL2008

Chargement

Focused electron- and ion-beam induced processes

Vinzenz Friedli

EPFL2008