Intensity (physics) | EPFL Graph Search

In physics, the intensity or flux of radiant energy is the power transferred per unit area, where the area is measured on the plane perpendicular to the direction of propagation of the energy. In the SI system, it has units watts per square metre (W/m2), or kg⋅s−3 in base units. Intensity is used most frequently with waves such as acoustic waves (sound) or electromagnetic waves such as light or radio waves, in which case the average power transfer over one period of the wave is used. Intensity can be applied to other circumstances where energy is transferred. For example, one could calculate the intensity of the kinetic energy carried by drops of water from a garden sprinkler. The word "intensity" as used here is not synonymous with "strength", "amplitude", "magnitude", or "level", as it sometimes is in colloquial speech. Intensity can be found by taking the energy density (energy per unit volume) at a point in space and multiplying it by the velocity at which the energy is moving.

Vertical "III-V" V-Shaped Nanomembranes Epitaxially Grown on a Patterned Si[001] Substrate and Their Enhanced Light Scattering

Sonia Conesa Boj, Anna Dalmau Mallorquí, Martin Heiss, Eleonora Russo, Ludovit Pavel Zweifel

We report on a new form of III-IV compound semiconductor nanostructures growing epitaxially as vertical V-shaped nanomembranes on Si(001) and study their light-scattering properties. Precise position control of the InAs nanostructures in regular arrays is demonstrated by bottom-up synthesis using molecular beam epitaxy in nanoscale apertures on a SiO2 mask. The InAs V-shaped nanomembranes are found to originate from the two opposite facets of a rectangular pyramidal island nucleus and extend along two opposite < 111 > B directions, forming flat {110} walls. Dark-field scattering experiments, in combination with light-scattering theory, show the presence of distinctive shape-dependent optical resonances significantly enhancing the local intensity of incident electromagnetic fields over tunable spectral regions. These new nanostructures could have interesting potential in nanosensors, infrared light emitters, and nonlinear optical elements.

American Chemical Society2012

Shannon entropy and degree of polarization of a speckle pattern

Abhijit Roy

The dependence of the Shannon entropy (SE) of a speckle pattern on the degree of polarization (DoP) of the pattern is investigated both experimentally and numerically. The superposition of two uncorrelated speckle patterns with polarization diversity is utilized to control the DoP of the superposed speckle pattern, and the SE of the pattern is estimated from the determined probability density function of intensity of the pattern. The SE is observed to be increasing quadratically with the DoP of the speckle pattern. The experimental observations are supported by the numerical studies. As the change of the SE indicates a change in the randomness of the intensity distribution, the variation of the standard deviation of intensity with the DoP is also investigated. Moreover, a linear relation between the SE and the standard deviation of intensity of a speckle pattern is also established. (C) 2021 Optical Society of America

OPTICAL SOC AMER2021

Diffractionless Fourier Domain Microscopy

Cédric Blatter, Theo Lasser, Rainer Leitgeb, Tilman Schmoll

Several methods have been proposed and realized to increase the lateral resolution in microscopy and ultimately to beat the actual diffraction limit as stated by Abbe. Structured illumination for example enhances the lateral resolution by virtually extending the spatial frequency support of the system transfer function. Higher spatial frequencies are in fact mapped into the range covered by the detection transfer function. The set of spatial frequencies can be further enhanced by decoupling illumination and detection and by employing concepts similar to synthetic apertures. We present a novel method for diffractionless microscopic imaging – Fourier Domain or k-Microscopy[1] (FDM). Again we decouple illumination from detection to achieve a lateral resolution that is independent of the detection numerical aperture. Similar to structured illumination we produce a set of fringes covering a band of spatial frequencies on the sample. However, instead of detecting with an area sensor we use a simple PIN detector: By tuning the spatial frequency of the illumination we obtain the Fourier coefficient from the measured total backscattered or transmitted intensity for the particular spatial frequency in the sample dimension normal to the fringe orientation. The fringe pattern is obtained from two collimated coherent beams that are superimposed. The spatial frequency of the pattern is controlled via tuning the wavelength. In order to obtain an unambiguous Fourier representation of the one dimensional sample structure it is necessary to record at least two π/2 phase shifted copies of the frequency response signal. The lateral resolution is then determined by the tuning bandwidth of the laser as well as the subtended angle and the central wavelength of the laser. This relation is in fact very similar to the concept of Fourier Domain Optical Coherence tomography, only that it acts on the transverse instead of the longitudinal resolution. We give first experimental proof of the concept in one dimension using a slowly tuning broad- bandwidth Ti:Sapph laser. We resolve the defined structure of a resolution test target. A particular feature of the method is that the reconstructed sample will appear spatially band-pass filtered due to the finite spectral support given by the tuned fringe frequencies. Hence only the edges of the test target lines are visible. We believe that the concept of FDM will greatly benefit from new developments in rapidly- wavelength tuning source technology that recently entered the field of OCT. 1. M. Geissbuehler, T. Lasser, and R. A. Leitgeb, "K- Microscopy - resolution beyond the diffraction limit," in Progress in Biomedical Optics and Imaging - Proceedings of SPIE(2008).

2011

Diffractionless Fourier Domain Microscopy

Cédric Blatter, Theo Lasser, Rainer Leitgeb, Tilman Schmoll

2011