Publications associées à Axonometric projection

Perspective Aware Road Obstacle Detection

Pascal Fua, Mathieu Salzmann, Krzysztof Maciej Lis, Sina Honari

While road obstacle detection techniques have become increasingly effective, they typically ignore the fact that, in practice, the apparent size of the obstacles decreases as their distance to the vehicle increases. In this letter, we account for this by c ...

2023

System, device and method for quantum correlation measurement with single photon avalanche diode arrays

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic

A system for photon correlation of an illuminated object and/or a light source, including a light source for illuminating the object or to correlate, an optical system having an object-facing side configured to face the object or the light source and a pro ...

2020

Joint Angular Refinement and Reconstruction for Single-Particle Cryo-EM

Michaël Unser, Laurène Donati, Emmanuel Emilien Louis Soubies, Mona Zehni

Single-particle cryo-electron microscopy (cryo-EM) reconstructs the three-dimensional (3D) structure of bio-molecules from a large set of 2D projection images with random and unknown orientations. A crucial step in the single-particle cryo-EM pipeline is 3 ...

2020

Pictorial System Usability Scale (P-SUS): Developing an Instrument for Measuring Perceived Usability

Andreas Sonderegger

We have developed a pictorial multi-item scale, called P-SUS (Pictorial System Usability Scale), which aims to measure the perceived usability of mobile devices. The scale is based on the established verbal usability questionnaire SUS (System Usability Sca ...

ASSOC COMPUTING MACHINERY2019

New Approaches to Artistic Synthesis Relying on Visual Perception

Mahmut Sami Arpa

Artists often take advantage of the limitations of the human visual system to create art that provides new experiences for the observers. Similarly, in this thesis, we explore new computational artistic compositions that create new visual experiences by re ...

EPFL2019

Heat flux analysis of Type-I ELM impact on a sloped, protruding surface in the JET bulk tungsten divertor

Olivier Sauter, Ambrogio Fasoli, Basil Duval, Stefano Coda, Martinus Gijs, Jonathan Graves, Yves Martin, Duccio Testa, Patrick Blanchard, Bruno Emanuel Ferreira De Sousa Correia

Tungsten (W) melting due to transient power loads, for example those delivered by edge localised modes (ELMs), is a major concern for next step fusion devices. A series of experiments has been performed on JET to investigate the dynamics of Type-I ELM-indu ...

Elsevier2018

III-Nitride Semiconductor Photonic Nanocavities on Silicon

Ian Michael Rousseau

Optical nanocavities enhance light-matter interaction due to their high quality factors (Q) and small modal volumes (V). The control of light-matter interaction lies at the heart of potential applications for integrated optical circuits, including optical ...

EPFL2018

Shape from bandwidth: the 2-D orthogonal projection case

Martin Vetterli, Benjamin Bejar Haro, Adam James Scholefield

Could bandwidth—one of the most classic concepts in signal processing—have a new purpose? In this paper, we investigate the feasibility of using bandwidth to infer shape from a single image. As a first analysis, we limit our attention to orthographic proje ...

Ieee2017

High-Quality Parallel-Ray x-Ray CT Back Projection Using Optimized Interpolation

Michaël Unser, Michael Thompson McCann

We propose a new, cost-efficient method for computing back projections in parallel-ray X-ray CT. Forward and back projections are the basis of almost all X-ray CT reconstruction methods, but computing these accurately is costly. In the special case of para ...

2017

Compressed Sensing for Dose Reduction in STEM Tomography

Michaël Unser, Laurène Donati, Masih Nilchian

We designed a complete acquisition-reconstruction framework to reduce the radiation dosage in 3D scanning transmission electron microscopy (STEM). Projection measurements are acquired by randomly scanning a subset of pixels at every tilt-view (i.e., random ...

IEEE2017