Publications de Pierre Jacquot

Validation of the ICRF antenna coupling code RAPLICASOL against TOPICA and experiments

Olivier Sauter, Basil Duval, Stefano Coda, Timothy Goodman, Yves Martin, Jean-Marc Moret, Duccio Testa, Patrick Blanchard, Bruno Marchand, Holger Reimerdes

In this paper we validate the finite element code RAPLICASOL, which models radiofrequency wave propagation in edge plasmas near ICRF antennas, against calculations with the TOPICA code. We compare the output of both codes for the ASDEX Upgrade 2-strap ante ...

IOP Publishing Ltd2019

Divertor Erosion Monitoring in ITER Using Two-Wavelength Speckle Interferometry

Pierre Jacquot, Eric Gauthier

ITER will operate long-time discharges (400 s) at high performances (Q = 10) and will have to satisfy strong safety and operational limits in term of tritium and dust inventory. This implies to control the erosion of the plasma facing components. Erosion m ...

Ieee-Inst Electrical Electronics Engineers Inc2014

Phase extraction in speckle interferometry by a circle fitting procedure in the complex plane

Pierre Jacquot, Sébastien Equis

In speckle interferometry (SI), temporal signals are amplitude- and frequency-modulated signals and exhibit a fluctuating background. Prior to phase computation, this background intensity must be eliminated. Here our approach is to build a complex signal f ...

Optical Society of America2011

Phase Extraction in Dynamic Speckle Interferometry with Empirical Mode Decomposition and Hilbert Transform

Pierre Jacquot, Sébastien Equis

In many respects, speckle interferometry (SI) techniques are being considered as mature tools in the experimental mechanics circles. These techniques have enlarged considerably the field of optical metrology, featuring nanometric sensitivities in whole-fie ...

Wiley-Blackwell2010

The empirical mode decomposition: a must-have tool in speckle interferometry?

Pierre Jacquot, Sébastien Equis

In a wider and wider range of research and engineering activities, there is a growing interest for full-field techniques, featuring nanometric sensitivities, and able to be addressed to dynamic behaviors characterization. Speckle interferometry (SI) techni ...

Optical Society of America2009