Personne

Davide Garetto

Cette personne n’est plus à l’EPFL

Publications associées (15)

À propos
Confidentialité
Mentions légales

Graph Chatbot

Chattez avec Graph Search

Posez n’importe quelle question sur les cours, conférences, exercices, recherches, actualités, etc. de l’EPFL ou essayez les exemples de questions ci-dessous.

AVERTISSEMENT : Le chatbot Graph n'est pas programmé pour fournir des réponses explicites ou catégoriques à vos questions. Il transforme plutôt vos questions en demandes API qui sont distribuées aux différents services informatiques officiellement administrés par l'EPFL. Son but est uniquement de collecter et de recommander des références pertinentes à des contenus que vous pouvez explorer pour vous aider à répondre à vos questions.

Connectez-vous pour utiliser Chat avec Graph Search

Davide Garetto

Graph Chatbot

Chattez avec Graph Search

Surface potential compact model for embedded flash devices oriented to IC memory design

Numerical and Compact Modeling of Embedded Flash Memory Devices Targeted for IC Design

Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part I: Impedance Analysis

Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part II: Transient Effects

Surface potential compact model for embedded flash devices oriented to IC memory design

Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model

Comparing defect characterization techniques with non-radiative multiphonon charge trapping model AC analysis, trap-assisted-tunneling and charge pumping

Characterization and 3D TCAD simulation of NOR-type flash non-volatile memories with emphasis on corner effects

Characterization and physical modeling of endurance in embedded non-volatile memory technology

AC analysis of defect cross sections using non-radiative MPA quantum model

Surface potential compact model for embedded flash devices oriented to IC memory design

Surface potential compact model for embedded flash devices oriented to IC memory design

Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part I: Impedance Analysis

Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part II: Transient Effects

Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model

Comparing defect characterization techniques with non-radiative multiphonon charge trapping model AC analysis, trap-assisted-tunneling and charge pumping

AC analysis of defect cross sections using non-radiative MPA quantum model

Characterization and physical modeling of endurance in embedded non-volatile memory technology

Characterization and 3D TCAD simulation of NOR-type flash non-volatile memories with emphasis on corner effects

Numerical and Compact Modeling of Embedded Flash Memory Devices Targeted for IC Design