Nanometric crystal defects in transmission electron microscopy
Publications associées (63)
Graph Chatbot
Chattez avec Graph Search
Posez n’importe quelle question sur les cours, conférences, exercices, recherches, actualités, etc. de l’EPFL ou essayez les exemples de questions ci-dessous.
AVERTISSEMENT : Le chatbot Graph n'est pas programmé pour fournir des réponses explicites ou catégoriques à vos questions. Il transforme plutôt vos questions en demandes API qui sont distribuées aux différents services informatiques officiellement administrés par l'EPFL. Son but est uniquement de collecter et de recommander des références pertinentes à des contenus que vous pouvez explorer pour vous aider à répondre à vos questions.
We demonstrate the use of both pixelated differential phase contrast (DPC) scanning transmission electron microscopy (STEM) and off-axis electron holography (EH) for the measurement of electric fields and assess the advantages and limitations of each techn ...
Controlling and shaping radiation beams is fundamental for a better understanding of radiation-matter interaction and advancing experimental techniques for material characterization at high spatial resolution.In particular, the current trend in the miniatu ...
Convergent beam electron diffraction (CBED) patterns of twisted bilayer samples exhibit interference patterns in their CBED spots. Such interference patterns can be treated as off-axis holograms and the phase of the scattered waves, and hence the interlaye ...
Recently, a hexagonal phase has been reported in high carbon steels in several studies. Here, we show that the electron microscopy results used in these studies were erroneously interpreted. The extra-spots in the diffraction patterns and the odd contrasts ...
Advancing quantum technologies depends on the precise control of individual quantum systems, the so-called qubits, and the exploitation of their quantum properties. Nowadays, expanding the number of qubits to be entangled is at the core of the developments ...
The physical properties of many modern multi-component materials are determined by their internal microstructure. Tools capable of characterizing complex nanoscale architectures in composite materials are, therefore, essential to design materials with targ ...
Scanning transmission electron microscopy (STEM) imaging using diffraction contrast is a powerful technique to assess crystal defects. In this work it is used to assess the spatial distribution of radiation induced defect in tungsten. In effect, its irradi ...
We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowi ...
The AD-target (Antiproton Decelerator Target) is the main antiparticle production element of the CERNâs (European Organization for Nuclear Research) AD (Antiproton Decelerator) complex. Antiprotons are produced by colliding a pulsed 1.5 * 10^13 ppp (prot ...
Transient absorption in the Visible and in the deep-UV is performed on MAPbBr(3) thin films with 3.1 eV pump excitation. The UV probe can access higher order transitions in the material exploring different high-symmetry points of the Brillouin zone. Uncorr ...