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Thickness dependent loss function of Si with 0.14 eV energy resolution

Publications associées (63)

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Electron spectrometer calibration method

Tobias Kippenberg, Fabrizio Carbone, Alexey Sapozhnik, Yujia Yang, Thomas La Grange, Arslan Sajid Raja

The present invention concerns an energy dispersion calibration method for calibrating an electron spectrometer of an electron spectrometer system including at least one electron emission source, electron optics and the electron spectrometer. The method co ...

2023

Ultrafast Transverse Modulation of Free Electrons by Interaction with Shaped Optical Fields

Fabrizio Carbone, Alexey Sapozhnik, Phoebe Marie Tengdin, Giovanni Maria Vanacore, Ivan Madan, Ido Kaminer, Simone Gargiulo, Francesco Barantani, Veronica Leccese

Spatiotemporal electron-beam shaping is a bold frontier of electron microscopy. Over the past decade, shaping methods evolved from static phase plates to low-speed electrostatic and magnetostatic displays. Recently, a swift change of paradigm utilizing lig ...

AMER CHEMICAL SOC2022

In an era of new developments in nanomaterials analysis enabled by the unprecedented spatial and energy resolutions of electron energy-loss spectroscopy in the scanning transmission electron microscope (STEM-EELS), it remains that the vast majority of work ...

2021

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Nanoscale mapping of the distinct electronic phases characterizing the metal-insulator transition displayed by most of the rare-earth nickelate compounds is fundamental for discovering the true nature of this transition and the possible couplings that are ...

AMER CHEMICAL SOC2021

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The chemi-ionization of Ar, Kr, N2, H2, and D2 by Ne(3P2) and of Ar, Kr, and N2 by He(3S1) was studied by electron velocity map imaging (e-VMI) in a crossed molecular beam experiment. A curved magnetic hexapole was used to state-select the metastable speci ...

2021

A method to numerically determine the secondary electron yield considering effects of the surface morphology

Guang-Yu Sun, Ning Yang

Secondary electron emission (SEE) of solid materials due to electron bombardment is influenced by numerous properties of materials, where the surface condition plays a critical role in the value of secondary electron yield (SEY). Here, a 3D random microstr ...

2021

Structure evolution, bandgap, and dielectric function in La-doped hafnium oxide thin layer subjected to swift Xe ion irradiation

Philippe Buffat, Elena Suvorova Buffat

High-resolution transmission electron microscopy, electron diffraction, and electron energy-loss spectroscopy provide information on the structural evolution, dielectric function, and bandgap values of nanocrystalline 10nm thick lanthanum doped hafnia (La: ...

AMER INST PHYSICS2020

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Formation and characterization of low-dimensional nanostructures is crucial for controlling the properties of two-dimensional (2D) materials such as graphene. Here, we study the structure of low-dimensional adsorbates of cesium iodide (CsI) on freestanding ...

2020

Visualizing the importance of oxide-metal phase transitions in the production of synthesis gas over Ni catalysts

Stéphane François Jean Poitel

Synthesis gas, composed of H-2 and CO, is an important fuel which serves as feedstock for industrially relevant processes, such as methanol or ammonia synthesis. The efficiency of these reactions depends on the H-2 : CO ratio, which can be controlled by a ...

2020

The implementation of ultrasoft pseudopotentials into time-dependent density-functional perturbation theory is detailed for both the Sternheimer approach and the Liouville-Lanczos (LL) method, and equations are presented in the scalar relativistic approxim ...

AMER PHYSICAL SOC2020