2PFC (Two Pixels, Full Color): Image Sensor Demosaicing and Characterization

We propose a modification to the standard Bayer CFA and photodiode structure for CMOS image sensors, which we call 2PFC (Two Pixels, Full Color). The blue and red filters of the Bayer pattern are replaced by a magenta filter. Under each magenta filter are two stacked, pinned photodiodes; the diode nearest the surface absorbs mostly blue light and the deeper diode absorbs mostly red light. The magenta filter absorbs green light, improving color separation between the blue and red diodes. We first present a frequency-based demosaicing method, which takes advantage of the new 2PFC geometry. Due to the spatial arrangement of red, green, and blue pixels, luminance and chrominance are very well separated in the Fourier space, allowing for computationally inexpensive linear filtering. In comparison with state-of-the-art demosaicing methods for the Bayer CFA, we show that our sensor and demosaicing method outperform the others in terms of color aliasing, PSNR, and zipper effect. As demosaicing alone does not determine image quality, we also analyze the whole system performance in terms of resolution and noise.

2PFC™ Image Sensors: Better Image Quality at Lower Cost

Daniel Tamburrino

A modification to the standard Bayer CFA and photodiode structure for CMOS image sensors is proposed, which we call 2PFC™, meaning “Two Pixel, Full Color”. The blue and red filters of the Bayer pattern are replaced by magenta filters. Under each magenta filter are two stacked, pinned photodiodes; the diode nearest the surface absorbs mostly blue light and the deeper diode absorbs mostly red light. The magenta filter absorbs green light, improving color separation between the resulting blue and red diodes. The dopant implant defining the bottom of the red-absorbing region can be made the same as the green diodes, simplifying the fabrication. Since the spatial resolution for the red, green, and blue channels are identical, color aliasing is greatly reduced. Luminance resolution can also be improved, the thinner diodes lead to higher well capacity with resulting better dynamic range, and fabrication costs can be similar to or less than standard Bayer CMOS imagers. Also, the geometry of the layout lends itself naturally to frequency-based demosaicing.

2009

A Sub-0.5 Electron Read Noise VGA Image Sensor in a Standard CMOS Process

Assim Boukhayma, Christian Enz, Arnaud Peizerat

A sub-0.5e−rms temporal read noise VGA (640H×480V) CMOS image sensor has been integrated in a standard 0.18μm 4PM CMOS process. The low noise performance is achieved exclusively through circuit optimization without any process refinements. The presented imager relies on a 4T pixel of 6.5μm pitch with a properly sized and biased thin oxide PMOS source follower. A full characterization of the proposed image sensor, at room temperature, is presented. With a pixel bias of 1.5μA the sensor chip features an input-referred noise histogram from 0.25 e−rms to a few e−rms peaking at 0.48 e−rms. The imager features a full well capacity of 6400 e− and its frame rate can go up to 80 fps. It also features a fixed pattern noise as low as 0.77%, a lag of 0.1% and a dark current of 5.6e-/s. It is also shown that the implementation of the in-pixel n-well does not impact the quantum efficiency of the pinned photo-diode.

Ieee-Inst Electrical Electronics Engineers Inc2016

Application of CMOS image sensors in optical sectioning and polarization microscopy

Jelena Mitic

In this thesis new imaging approaches for optical microscopy are proposed and studied. They are based on the use of dynamic structured illumination in combination with a demodulation detection concept employing CMOS image detectors. Two particular implementations are suggested: real-time optical sectioning microscopy and whole field quantitative polarization microscopy. Optical sectioning, i.e depth resolved imaging, allows observation of thin sections in volumetric samples. In its classical configuration the wide-field microscope does not allow optical sectioning of the investigated objects. In this thesis the optical sectioning in a wide-field microscope is achieved by illuminating the sample with a continuously moving single spatial frequency pattern, which temporarily modulates the signal obtained on the photodetector. Only the object parts that are in the focus have a good contrast and consequently generate stronger signal on the detector. The optically sectioned images are obtained employing a CMOS image detector, which demodulates the time-dependent component of the image. Two different systems for real-time acquisition of optically sectioned images are proposed. The first one is based on a specially designed smart-pixel-detector-array (SPDA), which allows performing the signal processing by an electronic circuit integrated to each pixel of the sensor. The second system utilizes a commercial CMOS image sensor. Here, the images are treated by a digital signal processor (DSP) integrated into the camera (iMVS-155). Both approaches provide real-time acquisition of optically sectioned images. The proof of principle for the new method is demonstrated by imaging artificial three-dimensional reflective samples. The optical sectioning imaging of biological samples in bright-field mode and in fluorescence mode is also demonstrated. The optical sectioning performances of the studied systems are similar to that of the confocal microscope. However the new method has some advantages over the classical confocal system: e.g. the difficulties with the alignment and the post-processing inherent to the confocal system are avoided. The theoretical framework presented in the thesis describes the image formation in structured illumination for both reflective and fluorescent samples. The influence of longitudinal chromatic aberration and spherical aberration caused by specimen induced index mismatch on depth discrimination property are studied. In extension to the work related to optically sectioned microscopy, the quantitative polarization microscopy imaging method is proposed as a new application for CMOS detectors. The polarization state of the illuminating light is dynamically changed and the demodulation detection approach is employed to extract the retardance and azimuth of the birefringent sample in real-time; for a whole field of view. Examples of polarization sensitive measurements for different samples are presented. The theoretical analysis is performed using the Jones formalism. Finally, the potentials and limitations of the CMOS detectors for applications in optical microscopy are discussed. Thanks to constant advancements in CMOS technology, the acquisition speed, resolution and sensitivity of new CMOS detectors generations have been improved. This will allow adapting the methods proposed in this thesis for investigations of fast dynamic process where high temporal and spatial resolution is required.

EPFL2004

Application of CMOS image sensors in optical sectioning and polarization microscopy

Jelena Mitic

EPFL2004