Energy-filtered environmental transmission electron microscopy for the assessment of solid-gas reactions at elevated temperature: NiO/YSZ-H-2 as a case study
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Crystal damage induced by irradiation is investigated using transmission electron microscopy (TEM) coupled to molecular dynamics (MD) calculations. The displacement cascades are simulated for energies ranging from 10 to 50 keV in Al, Ni and Cu and for time ...
Building upon the similarities between inelastic electron scattering and X-ray absorption we show that dichroism can be observed in electron energy loss spectrometry (EELS) in the transmission electron microscope (TEM). Natural or magnetic linear dichroism ...
Thirteen different commercial TiO2 powders with specific surface areas varying from 9 to 335 m/g and with isoelectric points (IEP) from 3 to 7.5 were investigated for their catalytic activity in E. coli inactivation. The TiO2 samples zeta potential, attenu ...
The microstructure, chemical and phase composition of the hard Ni-P-Ti layer formed on the Ti-6Al-4V alloy after duplex surface treatment were investigated by light microscopy, X-ray diffraction, scanning electron microscopy and analytical/high-resolution ...
We have synthesized Si Nps rich submicron area within a thin SiO2 layer using a new method called “stencil-masked ion implantation”. It consists in implanting silicon ions at ultra-low energy through windows (from 50nm to 2μm) opened in a stencil mask cont ...
Microstructure, chemical and phase composition of the hard layer formed on the Ti-6Al-4V alloy after duplex surface treatment were investigated by light microscopy (LM), X-ray diffraction (XRD) and analytical scanning, transmission and scanning transmissio ...
Photoluminescence (PL) spectroscopy has been demonstrated as a suitable technique to characterize Si nanocrystal-based non-volatile memory devices (Carrada et al. APL 2005). These are formed by a single plane of Si nanocrystals (NCs) buried in the gate oxi ...
The possibility of controlling materials properties by tailoring their substructure at the nanometer scale is a current topic of great interest. To do so, a fundamental understanding of the growth mechanism is of key importance and an analytical challenge ...
Information for phase identification may be gathered in the electron transmission microscope with spatial resolution down to the nanometre scale. Energy dispersive X-ray and electron energy loss spectrometries are based on inelastic electron/sample interac ...
The use of electron energy loss spectroscopy (EELS) in determining the electronic properties of Si and thickness dependent loss function of Si with 0.14 eV energy resolution were investigated. The dielectric response function was used to describe the inter ...