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Deformation in nanocrystalline (NC) materials is strongly influenced by the presence of a large fraction of grain boundaries. We present a comparative study on the role of intragranular root-mean-square strain and crystal-lographic texture on recovery processes. The detailed microstructure analysis with conventional X ray diffraction and in-situ synchrotron measurements during deformation are used to understand the various attributes of recovery mechanisms associated with annealing and deformation of electrodeposited NC nickel (grain size = 30 nm). Our results emphasize the dominance of local atomic rearrangements during thermal recovery processes, while deformation induced recovery processes are supported primarily by large-scale dislocation activity. The in-situ deformation of NC samples with two different textures illustrates further the influence of gran boundary character on recovery processes.
Sandy Sanchez Alonso, Ulf Anders Hagfeldt, Michael Saliba
Paul Muralt, Ramin Matloub Aghdam, Silviu Cosmin Sandu, Stefan Mertin, Mohammad Fazel Parsapour Kolour, Vladimir Pashchenko
Sandrine Gerber, Laure Menin, Daniel Ortiz Trujillo, Jérémy Vuilleumier, Raphaël Jovita De Matos, Luigi Bonacina