Load cell with positive, negative and zero stiffness operating modes for milli- to nanonewton contact force monitoring in electrical probing
Graph Chatbot
Chattez avec Graph Search
Posez n’importe quelle question sur les cours, conférences, exercices, recherches, actualités, etc. de l’EPFL ou essayez les exemples de questions ci-dessous.
AVERTISSEMENT : Le chatbot Graph n'est pas programmé pour fournir des réponses explicites ou catégoriques à vos questions. Il transforme plutôt vos questions en demandes API qui sont distribuées aux différents services informatiques officiellement administrés par l'EPFL. Son but est uniquement de collecter et de recommander des références pertinentes à des contenus que vous pouvez explorer pour vous aider à répondre à vos questions.
Grippers, currently used in Industry, are not suited for clean room application. Thus, a novel type of smart gripper is being designed using Shape Memory Alloys (SMA). In the development of this Smart Gripper, the modelling of the material is quite critica ...
After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...
Nanopores are nanometer sized openings that are the connection between two electrolyte filled reservoirs. The measurement of the ion transport flowing through such a pore allows to probe physically or biologically interesting phenomena. These range from th ...
EPFL2020
, , ,
This article describes a novel method for applying a contact force in the range of 1 to 100 μN with pointed probe on a microscale sample in order to perform ohmic electrical measurements. The solution is based on the new TIVOT active load cell combining th ...
2022
, ,
In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a ...
BEILSTEIN-INSTITUT2020
, ,
A method for performing H-spline compatible isogeometric analysis (IGA) on a geometric object, the method being performed on a computer device having a memory, the method including the steps of creating an analysis suitable geometry (ASG) using H-splines f ...
Confocal microscopes use photomultiplier tubes and hybrid detectors due to their large dynamic range, which typically exceeds the one of single-photon avalanche diodes (SPADs). The latter, due to their photon counting operation, are usually limited to an o ...
The properties of a physical system only exist in relation to its environment. This thesis presents the development of a novel spin qubit scanning probe microscope operating over a wide range of environmental conditions. The qubit, which sits at the heart ...
The goal of achieving 'universal grasping' where many objects can be handled with minimal control input is the focus of much research due to potential high impact applications ranging from grocery packing to recycling. However, many of the grippers develop ...
Institute of Electrical and Electronics Engineers Inc.2020
The imaging of integrated circuits across different length scales is required for failure analysis, design validation and quality control. At present, such inspection is accomplished using a hierarchy of different probes, from optical microscopy on the mil ...
