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Load cell with positive, negative and zero stiffness operating modes for milli- to nanonewton contact force monitoring in electrical probing

Related publications (37)

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After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

The properties of a physical system only exist in relation to its environment. This thesis presents the development of a novel spin qubit scanning probe microscope operating over a wide range of environmental conditions. The qubit, which sits at the heart ...

EPFL2023

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This article describes a novel method for applying a contact force in the range of 1 to 100 μN with pointed probe on a microscale sample in order to perform ohmic electrical measurements. The solution is based on the new TIVOT active load cell combining th ...

2022

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

Georg Fantner, Santiago Harald Andany, Charlène Cécile Geneviève Brillard

In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a ...

BEILSTEIN-INSTITUT2020

Fundamental Applications of Nanopores: Controlled DNA Translocations to Nanofluidics

Sebastian James Davis

Nanopores are nanometer sized openings that are the connection between two electrolyte filled reservoirs. The measurement of the ion transport flowing through such a pore allows to probe physically or biologically interesting phenomena. These range from th ...

EPFL2020

Sensorization of a continuum body gripper for high force and delicate object grasping

Josephine Anna Eleanor Hughes

The goal of achieving 'universal grasping' where many objects can be handled with minimal control input is the focus of much research due to potential high impact applications ranging from grocery packing to recycling. However, many of the grippers develop ...

Institute of Electrical and Electronics Engineers Inc.2020

Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom

Gabriel Aeppli, Manuel Guizar Sicairos, Christian David, Michal Odstrcil

The imaging of integrated circuits across different length scales is required for failure analysis, design validation and quality control. At present, such inspection is accomplished using a hierarchy of different probes, from optical microscopy on the mil ...

NATURE PUBLISHING GROUP2019

Grippers, currently used in Industry, are not suited for clean room application. Thus, a novel type of smart gripper is being designed using Shape Memory Alloys (SMA). In the development of this Smart Gripper, the modelling of the material is quite critica ...

2019

System and method for performing isogeometric analysis and finite element analysis using h-splines

Michaël Unser, Zsuzsanna Püspöki, Daniel Andreas Schmitter

A method for performing H-spline compatible isogeometric analysis (IGA) on a geometric object, the method being performed on a computer device having a memory, the method including the steps of creating an analysis suitable geometry (ASG) using H-splines f ...

2019

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Confocal microscopes use photomultiplier tubes and hybrid detectors due to their large dynamic range, which typically exceeds the one of single-photon avalanche diodes (SPADs). The latter, due to their photon counting operation, are usually limited to an o ...

2018