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Advances in High-Speed, Multiparametric Atomic Force Microscopy

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Advances in High-Speed Atomic Force Microscopy

Adrian Pascal Nievergelt

High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...

EPFL2018

Microfluidic bacterial traps for simultaneous fluorescence and atomic force microscopy

Georg Fantner, Jonathan David Adams, Oliver Peric, Mélanie Thérèse Marie Hannebelle

The atomic force microscope has become an established research tool for imaging microorganisms with unprecedented resolution. However, its use in microbiology has been limited by the difficulty of proper bacterial immobilization. Here, we have developed a ...

2017

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Nearly all scanning probe microscopes (SPMs) contain a feedback controller, which is used to move the scanner in the direction of the z-axis in order to maintain a constant setpoint based on the tip-sample interaction. The most frequently used feedback con ...

2017

We present a scanning probe microscopy technique for spatially resolving transport in cold atomic gases, in close analogy with scanning gate microscopy in semiconductor physics. The conductance of a quantum point contact connected to two atomic reservoirs ...

American Physical Society2017

The 2D-molecular thin film analysis protocol for fully grown mice oocytes is described using an innovative approach. Time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), atomic force microscopy (AFM) and optical mi ...

Royal Soc Chemistry2016

Mass Spectrometry as a Preparative Tool for the Surface Science of Large Molecules

Klaus Kern, Markus Ternes, Stephan Rauschenbach

Measuring and understanding the complexity that arises when nanostructures interact with their environment are one of the major current challenges of nanoscale science and technology. High-resolution microscopy methods such as scanning probe microscopy hav ...

Annual Reviews2016

Advances in self-sensing techniques for atomic force microscopy

Maja Dukic Pjanic

Atomic force microscope (AFM) is a tool that allows micro and nano scale imaging of samples ranging from solid state physics to biology. AFM uses mechanical forces to sense the sample and recreate a topography image with high spatial resolution. The bigges ...

EPFL2016

Nanoscopy in nonlinear scanning fluorescence imaging systems

Grégoire Pierre Jean Laporte

In the last 30 years, superresolution in optical microscopy has been a major field of research. During this time, different techniques have been created to break the diffraction limit in order to make observations at a nanometric scale. Given that optical ...

EPFL2016

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Semiconductor nanowires are emerging as promising building blocks for biosensors enabling direct electrical detection of various biomolecules. In this framework, two-terminal Schottky-barrier silicon (Si) nanowire arrays that exhibit memristive electrical ...

2016

Design of a high-bandwidth tripod scanner for high speed atomic force microscopy

Georg Fantner, Nahid Hosseini, Maja Dukic Pjanic, Chen Yang, Jie Zhao

Tip-scanning high-speed atomic force microscopes (HS-AFMs) have several advantages over their sample-scanning counterparts. Firstly, they can be used on samples of almost arbitrary size since the high imaging bandwidth of the system is immune to the added ...

2016