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A simple method has been developed for the prodn. of Au surfaces which are uniformly flat over large areas. Si wafers serve as substrates for the evapn. of thin Au layers. A glass slide glued onto the Au film allows successful sepn. of the Au layer from th ...
A dual axis, raster-scanning laser display based on a monolithic micromachined scanning mirror is presented. The scanner consists of a micromirror located at the end of a thermally actuated bimorph beam. The novelty of the device is that an "L"-shape canti ...
We have fabricated an xy-microstage with integrated protruding tip and electrostatic comb actuators for scanning probe surface imaging. This device, which is micromachined in monocrystalline silicon, nas been actuated and characterized and, for the first t ...
We report on the first successful operation of a scanning force microscope using microfabricated capacitive force sensors. The sensors, which are made from single crystal silicon on insulator wafers, consist of a cantilever spring with integrated tip at th ...
Fluorescence resonance energy transfer (FRET) was obsd. between donor dye mols. deposited onto the sample surface and acceptor dye mols. deposited onto the scanning near-field optical microscope (SNOM) or at. force microscope tip. FRET was obsd. only when ...
A new method for measuring local interfacial impedance properties with high lateral resolution was developed by combination of electrochemical impedance spectroscopy (EIS) with scanning electrochemical microscopy (SECM). Alternating current scanning electr ...
Beam distortion profiles are studied for scanning devices that have a single mirror with two rotational degrees of freedom (DOF), also named tip/tilt scanners. The case of a fast steering scanner used for high power material processing applications is stud ...