Scanning Probe Microscopy: Forces, Tips, and Probes

This lecture covers the principles of Scanning Probe Microscopy (SPM), focusing on the forces involved in Atomic Force Microscopy (AFM), including capillary, van der Waals, and adhesion forces. It explains the interaction between inter-atomic forces and the distance between atoms, as well as the force-distance curves in AFM. The lecture also discusses the impact of tip shape on resolution limits, the fabrication of microfabricated silicon tips, and the material properties of SPM cantilever probes. Additionally, it explores the contact mode in SPM/AFM, capillary forces, tip sharpening techniques, and the fabrication of nanoprobes using micromachining methods.