Checking Probes-layer quality

This lecture covers the quality assessment of probes-layers using techniques such as Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy. It discusses topics like reflection coefficients, three-layers reflection, and the Fresnel coefficients. The instructor explains how to monitor self-assembly with light reflection, the evanescent wave, and negative dielectric constants in metals. The lecture also delves into the principles of a Plasmon Resonance-based Biosensor and the characterization of monoclonal antibodies. Various microscopy techniques like Transmission Electron Microscopy, Scanning Electron Microscopy, and Atomic Force Microscopy are explored for probe immobilization characterization.