Lecture

Atomic Force Microscopy: Resolution and SPR Applications

Description

This lecture covers the calculation of the maximum resolution in Atomic Force Microscopy (AFM) when using hemispherical tips of different radii and tilting angles. It also discusses the estimation of the thickness of a metal slice in Surface Plasmon Resonance (SPR) experiments to diminish the evanescent wave intensity. Additionally, it presents a practical SPR experiment for antigen detection, including sensor functionalization, flux variations, and data interpretation.

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