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Focused Ion Beam: Principles and Applications
This lecture covers the principles and applications of Focused Ion Beam (FIB) technology, including how it works, basic applications like imaging and milling, TEM sample preparation, FIB Nanotomography, and 3D microscopy. It explains why ions are used instead of electrons, focusing on their interaction with materials and the advantages of using Gallium. The lecture also delves into ion-solid interactions, different operating modes of FIB, and the process of ion milling. Additionally, it explores the fabrication of nanoscale structures, TEM sample preparation, and the challenges of serial sectioning for 3D reconstruction of microstructures.