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Scanning Probe Microscopy
This lecture covers the principles and applications of Scanning Probe Microscopy (SPM), focusing on techniques such as Electric Field Microscopy (EFM), Kelvin Force Microscopy (KF-AFM), Conductive AFM (CAFM), Spreading-resistance Microscopy (SSRM), and Magnetic Force Microscopy (MFM). It also discusses topics like Capacitance Microscopy (SCM), Chemically sensitive AFM, and Scanning Near-field Optical Microscopy (SNOM). The lecture explores the use of SPM in measuring voltage, current, resistivity, and magnetic forces, as well as its applications in lithography, temperature sensing, and chemical interactions.