Contacts: Semiconductor Devices II

This lecture covers the historical development of semiconductor devices, Moore's Law, CMOS Scaling, contact resistance in practice, influence on FET characteristics, quantum limit of resistance, contact resistance measurements, TLM, contact geometry, scaling, experimental review, electrical contacts to 2D materials, charge-injection mechanisms, Schottky barrier height extraction, phase engineering, doping, edge contacts, and direct transfer of contacts onto 2D materials.