Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.
Covers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.