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This lecture covers the components and operation of a Transmission Electron Microscope (TEM), including the vacuum system, electron gun emission mechanisms, high voltage tank, different types of electron sources, lenses, aberrations, and detectors. It explains the importance of vacuum for electron propagation, the emission of electrons from the cathode, the role of lenses in focusing electron beams, and the use of detectors such as CMOS cameras. The lecture also discusses the correction of aberrations, the functioning of the condenser and objective lens systems, and the projector lens system. It concludes with a summary highlighting the key aspects of TEM operation and the references for further study.