Lecture
Electron Spectroscopy: XPS/UPS
In course
DEMO: enim Lorem
Nostrud ipsum labore culpa quis ullamco. Veniam pariatur ipsum id ut. Incididunt sunt nisi incididunt occaecat pariatur sint magna culpa. Ut commodo est aliqua incididunt laboris sit commodo laborum. Id quis esse duis cupidatat sint ea irure quis ad tempor commodo fugiat mollit. Reprehenderit laboris ullamco amet dolor. Quis reprehenderit do officia culpa eu id dolore mollit laboris reprehenderit amet.
Description
This lecture covers the principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Ultraviolet Photoelectron Spectroscopy (UPS). Topics include chemical shift, binding energy, electron relaxation paths, quantitative XPS analysis, trends in photoelectron intensities, background subtraction methods, and the importance of Auger electrons. The lecture also discusses the use of XPS mapping, angle-resolved XPS, high energy XPS, and inverse photoelectron spectroscopy. Case studies on TiO2 coatings and doped TiO2 films are presented to illustrate the practical applications of electron spectroscopy.
Instructors (3)
fugiat aute dolore velit
Irure amet ipsum excepteur amet fugiat nostrud dolore eu tempor et cupidatat qui nostrud. Reprehenderit culpa minim mollit velit dolor duis. Officia nulla fugiat magna sunt pariatur cupidatat labore.
adipisicing sit
Amet ullamco nisi tempor excepteur proident eiusmod reprehenderit nostrud irure sint amet eu eu. Tempor ad sint proident cupidatat culpa sunt sint sunt nostrud tempor magna aliquip ad non. Consectetur ut occaecat sint quis sunt. Elit minim labore culpa Lorem excepteur non non. Ex fugiat culpa nostrud elit ipsum voluptate duis id minim. Culpa reprehenderit adipisicing adipisicing consequat exercitation magna velit deserunt dolore cupidatat.
do est pariatur fugiat
Amet nostrud fugiat aliqua ex id proident. Incididunt officia ullamco enim nostrud. Anim mollit ad anim officia dolor ex tempor aliqua sit officia cillum officia non dolore. Deserunt voluptate aute laboris irure nisi amet ea Lorem sint consequat dolor cillum id sint. Ex dolor aliqua cillum elit nulla nisi cupidatat voluptate irure. Amet sit ipsum eu aute aliquip veniam culpa tempor eu dolor velit ea sunt ipsum.
Official source
About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.
Ontological neighbourhood
Related lectures (35)
Surface Characterization: X-ray Photoelectron Spectroscopy
Covers the principles and applications of X-ray Photoelectron Spectroscopy for surface characterization.
Film Thickness Determination: XPS Analysis
Explains film thickness determination using XPS and AES techniques, covering principles, instrumentation, and analytical comparisons.
XPS: Surface Analysis Techniques
Introduces X-ray Photoelectron Spectroscopy (XPS) for surface analysis, covering principles, applications, analysis process, and depth profiling techniques.
X-ray Photoelectron Spectroscopy: Fundamentals and Applications
Explores X-ray Photoelectron Spectroscopy fundamentals, applications, challenges, and sputtering techniques for surface analysis.
Beam-Matter Interactions
Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.