Scanning Probe Microscopy

This lecture by the instructor covers the principles and applications of Scanning Probe Microscopy (SPM). It explains the working principle of SPM, including in-plane movement, out-of-plane motion, and tip-sample interaction. The lecture discusses the different types of SPM systems, such as AFM and Akiyama-Probe, and their applications in imaging, measurement, and multi-probe systems. It also delves into the comparison between piezotube and Zinc Oxide actuators, as well as the advantages of parallel probe systems. Furthermore, it explores the concepts of self-sensing and self-actuating probes, as well as the use of AFM in imaging light-sensitive samples and measuring displacement. The lecture concludes with a summary of various microscopy techniques at the nanometer scale, including optical, fluorescence, and confocal microscopy.