Chemical analysis: X-Ray photoelectron spectrometry

This lecture introduces X-Ray Photoelectron Spectrometry (XPS), a method developed by Kai Siegbahn in the 50's, which won the Nobel Prize in Physics in 1981. XPS is a surface analysis technique that provides qualitative and quantitative elemental analysis. It involves the emission of electrons from the surface of a material when excited by X-Rays. The lecture covers the interaction between X-Rays and matter, the components of an XPS instrument, the X-Ray tube, and the XPS mechanism. It also explains the role of the electron focusing system, the monochromator, and the electron detector. The lecture delves into qualitative analysis, XPS spectra interpretation, and quantitative analysis methods in XPS.