We demonstrate nanometer-level localization accuracy of a single fluorescent emitter in three dimensions. Our super resolution microscopy technique is based on spectral self-interference for axial localization and two-dimensional diffraction pattern analysis for lateral localization.
Christoph Merten, Jatin Panwar
Edoardo Charbon, Claudio Bruschini, Arin Can Ülkü, Yichen Feng
Julia Schmale, Ivo Fabio Beck, Alireza Moallemi, Margarida Teles Nogueira Rolo