Based on a Debye integral approach, we engineered an extended focal field distribution for Fourier domain optical coherence microscopy. This simulation optimizes beam con- figurations for high lateral resolution combined with extended depth of field.
Christian Depeursinge, Frédéric Montfort
Theo Lasser, Paul James Marchand, Arno Pino Bouwens, Jérôme Extermann, Séverine Coquoz
Demetri Psaltis, Abhijit Roy, Ahmed Ayoub