Publication
We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 mu m wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings positioned 1 mu m away from the waveguide core or by residual gratings located on the sidewalls of the waveguide. As a result, the dispersion curve of rectangular and slot waveguides as well as the group index dispersion are accurately determined. (C) 2007 Optical Society of America.
Romuald Houdré, Vincenzo Savona, Momchil Minkov, Mohamed Sabry Abdel-Aliem Mohamed
Tobias Kippenberg, Rui Ning Wang, Aleksandr Tusnin, Alisa Davydova, Miles Henry Anderson, Alexey Tikan