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An event-driven analogue-to-digital converter (ADC) architecture is proposed. The proposed architecture has less sensitivity to amplifier and DAC nonlinearity, and reduces the swing and dynamic common-mode range requirement of the operational transconductance amplifier and comparators, respectively. The efficiency of the ADC is confirmed by detailed circuit simulations.
Sandro Carrara, Junrui Chen, Kapil Bhardwaj
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