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This paper presents a low-power single-channel 8-bit loop-unrolled (LU) successive approximation register (SAR) analog-to-digital-converter (ADC) with a novel common-mode adaptive background comparator offset calibration scheme. LU-SAR ADCs use multiple comparators to reduce the SAR loop delay. Offset mismatch between the comparators severely degrades the effective resolution. This paper addresses the common-mode voltage variation in the LU-SAR architecture due to comparator kickback and the problems related to the common-mode dependency of the comparator offset. The proposed offset calibration scheme ensures that the comparators are calibrated at the same input common-mode voltage at which they each operate during the SAR conversion to prevent the common-mode dependent offset mismatch between them. Moreover, the proposed ADC design exploits the common-mode variation immunity of the proposed calibration scheme to optimize the figure-of-merit (FoM). The prototype ADC manufactured in 28nm FDSOI CMOS achieves 42.57dB signal-to-noise-and-distortion ratio and 22.8fJ/conv.-step FoM at 800MS/s with near Nyquist frequency input, and occupies an area of 0.0037mm(2).
Marco Mattavelli, Catherine Dehollain, Diego Ruben Barrettino, Kerim Türe, Mustafa Besirli
Kyojin Choo, Li Xu, Yimai Peng
Marco Mattavelli, Catherine Dehollain, Diego Ruben Barrettino, Kerim Türe, Mustafa Besirli, Franco Maloberti