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Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
Covers the basics of the reciprocal lattice in electron diffraction, including diffraction vector geometry and properties of reciprocal lattice unit cell vectors.
