Transmission electron microscopy

Related lectures (32)

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Explores Analytical Electron Microscopy techniques for chemical analysis using EELS and EDX.

Introduces the basics of Transmission Electron Microscopy, covering TEM user interface, camera settings, vacuum overview, and image analysis.

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Explores the history and operation of electron microscopes, focusing on components and resolving power.

Explores advanced SEM techniques and FIB technology for imaging and sample preparation.

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

Discusses the importance of sample preparation in electron microscopy and various techniques involved.