Concept

Low-voltage electron microscope

Related publications (307)

Application of Thomson scattering to helicon plasma sources

Ivo Furno, Patrick Blanchard, Alan Howling, Yanis Andrebe, Rémy Jacquier, Riccardo Agnello, Alban Sublet

The possibility of performing electron density and temperature measurements in a high power helicon plasma is a crucial issue in the framework of the AWAKE (Advanced WAKefield Experiment) project, which demonstrates acceleration of particles using GeV m(-1 ...

2020

Individual Barkhausen pulses of ferroelastic nanodomains

Dragan Damjanovic, Vasiliki Tileli, Reinis Ignatans

Ferroelectric materials, upon electric field biasing, display polarization discontinuities known as Barkhausen jumps, a subclass of a more general phenomenon known as crackling noise. Herein, we follow at the nanoscale the motion of 90 degree needle domain ...

2020

Comparative characterisation of non-monodisperse gold nanoparticle populations by X-ray scattering and electron microscopy

Francesco Stellacci, Stefan Guldin, Ye Yang, Zhi Luo, Suiyang Liao, Runzhang Qi

Accurate nanoparticle size determination is essential across various research domains, with many functionalities in nanoscience and biomedical research being size-dependent. Although electron microscopy is capable of resolving a single particle down to the ...

2020

Electron Beam Induced Copper Deposition from Carboxylate Precursors and the Study of Underlying Growth Mechanisms

Luisa Berger

The fabrication of defined and high-quality metal nanostructures is an ongoing topic of research. Direct-write deposition of copper nanostructures is of great value for many fields of research and industrial applications. Focused electron beam induced depo ...

EPFL2020

Structure evolution, bandgap, and dielectric function in La-doped hafnium oxide thin layer subjected to swift Xe ion irradiation

Philippe Buffat, Elena Suvorova Buffat

High-resolution transmission electron microscopy, electron diffraction, and electron energy-loss spectroscopy provide information on the structural evolution, dielectric function, and bandgap values of nanocrystalline 10nm thick lanthanum doped hafnia (La: ...

AMER INST PHYSICS2020

Nanosecond pulsed laser-processing of CVD diamond

Patrik Willi Hoffmann, Marco Cantoni, Sébastien Equis

This work considers the resulting material structural effects of laser-processing chemical vapor deposited (CVD) diamond. The utilized 532 nm wavelength laser had a pulse duration of 40 ns together with a spot diameter of ca. 40 mu m. The effect of cutting ...

ELSEVIER SCI LTD2020

Characterization of interfacial transition zone in concrete prepared with carbonated modeled recycled concrete aggregates

Karen Scrivener

Treatment by accelerated carbonation has been widely studied to enhance the quality of recycled concrete aggregates (RCA) and hence the performance of new concrete produced with the RCA. This is often ascribed to the densification of RCA. This study invest ...

PERGAMON-ELSEVIER SCIENCE LTD2020

Software Tools for Handling Magnetically Collected Ultra-thin Sections for Microscopy

Jelena Banjac

This report presents the software tools that will be available online to help users accurately segment ultra-thin sections of brain tissue in a large image to determine the section’s coordinates. In order to predict these coordinates, the goal was to use a ...

2019

Nanosecond electron pulses in the analytical electron microscopy of a fast irreversible chemical reaction

We show how the kinetics of a fast and irreversible chemical reaction in a nanocrystalline material at high temperature can be studied using nanosecond electron pulses in an electron microscope. Infrared laser pulses first heat a nanocrystalline oxide laye ...

Springer2019

Multi-modal and multi-scale non-local means method to analyze spectroscopic datasets

Vasiliki Tileli, Martial Duchamp

A multi-modal and multi-scale non-local means (M3S-NLM) method is proposed to extract atomically resolved spectroscopic maps from low signal-to-noise (SNR) datasets recorded with a transmission electron microscope. This method improves upon previously test ...

ELSEVIER2019

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